Ellipsometry is a non-destructive, optical measurement technique that characterizes the optical properties of thin films. It is highly sensitive to changes in the thickness and refractive index of the ...

Spectroscopic ellipsometry is widely adopted in semiconductor processing, such as in the manufacturing of integrated circuits, flat display panels, and solar cells. However, a conventional ...

The manual goniometer and the manual sample stage allow budget-conscious research and development labs to access cutting-edge rotating compensator ellipsometry. This flexible instrument can be ...

The manual goniometer and the manual sample stage allow budget-conscious research and development labs to access cutting-edge rotating compensator ellipsometry. This flexible instrument can be ...