Materials are known to interact with electromagnetic fields in different ways, which reflect their structures and underlying ...

Ellipsometry and reflectometry are optical measurement techniques used for surface analysis and thin-film characterization. 1 Both methods rely on light reflection but differ in their approach.

042700.KS HANMI Semiconductor Co., Ltd.

The anti-fouling character of polymer brushes against marine organisms was investigated by performing settlement tests with barnacle cypris larvae and mussel larvae in their adhesion period, as ...

Variable angle spectroscopic ellipsometry was also used to analyze the optical properties of the layers, providing insights into how different components interact within the device architecture.

Department of Chemical and Biomolecular Engineering, North Carolina State University, Raleigh, North Carolina 27695, United States ...

The University of Michigan, Ann Arbor, Michigan 48109, United States ...