Patel (ASIC Engineer, eInfochips Ltd) Nirav Nanavati (Tech Lead, eInfochips Ltd) Abstract Design for testability (DFT) and low power ... tester memory. Power reduction is needed during functional mode ...

“As wearable applications continue to expand, the demand for more immersive user interfaces featuring 3D-rendered content is growing, while ultra-low power consumption is still expected,” said ...